This textbook introduces students to the application methods of control charts to …
This textbook introduces students to the application methods of control charts to improve quality in health care. The textbook is written to be accessible to any student in the areas of health information management, health care informatics, and health care industrial engineering. Having a basic background in statistics would be beneficial, but such training is not a prerequisite to understanding how to apply the techniques discussed here. Several How-To sections are included to demonstrate the implementation of the given control charts using software such as Minitab and Excel. Additionally, samples of a Python code are included and can directly be accessed in a Jupyter Notebook at https://github.com/JeromeNN/Applications-Control-Charts-Quality-Improvement-Health-Care
This course explores statistical modeling and control in manufacturing processes. Topics include …
This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes.
This course provides the knowledge needed to effectively use Statistical Process Control …
This course provides the knowledge needed to effectively use Statistical Process Control (SPC). The relationship to quality costs, on-time delivery, concepts of variation, and an analysis of the organization-specific SPC applications will be introduced. Utilizing SPC to improve and maintain consistent production will be covered. The use of Lean manufacturing to shorten the time between the customer order and the product build/shipment by eliminating sources of waste will also be covered through the study of system performance, identification and elimination of waste, elimination of sources of variability, and a good understanding and use of the principles of operations management.
6.780 covers statistical modeling and the control of semiconductor fabrication processes and …
6.780 covers statistical modeling and the control of semiconductor fabrication processes and plants. Topics covered include: design of experiments, response surface modeling, and process optimization; defect and parametric yield modeling; process/device/circuit yield optimization; monitoring, diagnosis, and feedback control of equipment and processes; and analysis and scheduling of semiconductor manufacturing operations.
No restrictions on your remixing, redistributing, or making derivative works. Give credit to the author, as required.
Your remixing, redistributing, or making derivatives works comes with some restrictions, including how it is shared.
Your redistributing comes with some restrictions. Do not remix or make derivative works.
Most restrictive license type. Prohibits most uses, sharing, and any changes.
Copyrighted materials, available under Fair Use and the TEACH Act for US-based educators, or other custom arrangements. Go to the resource provider to see their individual restrictions.
